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Searching For EUV Mask Defects
US20070273626A1 - System for pixel defect masking and control thereof - Google Patents
Searching For EUV Mask Defects
Phase defect characterization on an extreme-ultraviolet blank mask using microcoherent extreme-ultraviolet scatterometry microscope: Journal of Vacuum Science & Technology B: Vol 31, No 6
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Analysis of phase defect effect on contact hole pattern using a programmed phase defect in EUVL mask
Detection of Printable EUV Mask Absorber Defects and Defect Adders by Full Chip Optical Inspection of EUV Patterned Wafers | Semantic Scholar
EUV multilayer defect characterization via cycle-consistent learning